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Books, Book Chapters and Refereed Papers in Books D
AVID
W
ILLIAMS
P
UBLICATIONS
, S
EMINARS
, R
ESEARCH
& T
EACHING
-- C
ONTENTS


Books, Book Chapters and Refereed Papers in Books ................................................................... 1
Refereed Journal Publications......................................................................................................... 6
Patents........................................................................................................................................... 16
Invited Talks at Conferences and Professional-Society Meetings................................................ 27
Conference and Abstract Publications .......................................................................................... 33
Teaching........................................................................................................................................ 50
Grants and Contracts 1994-to Present........................................................................................ 53



B
OOKS
, B
OOK
C
HAPTERS AND
R
EFEREED
P
APERS IN
B
OOKS

I. Books Written and Edited
Williams, D. B., Practical Analytical Electron Microscopy in Materials Science, 155 pp., Philips
Electron Optics Publishing Group, Mahwah, NJ (1984); also published by Verlag Chemie,
Deerfield Beach, FL (1984); revised editions published 1987 (Philips), 1990 (Tech Books).

Williams, D. B. and Joy, D. C. (Eds.) Analytical Electron Microscopy-1984, 378 pp., San
Francisco Press, San Francisco, CA (1984).

Hobbs, L. W., Westmacott, K. H. and Williams, D. B. (Eds.) Materials Problem Solving with the
Transmission Electron Microscope, 451 pp., Materials Research Society (Vol. 62),
Pittsburgh, PA (1986).

Peachey, L. D., and Williams, D. B., (Eds.) Electron Microscopy-1990, Proceedings of the XII
International Congress for Electron Microscopy, San Francisco Press, San Francisco, CA
(1990)
Vol. 1, Imaging Sciences, 615 pp.
Vol. 2, Analytical Sciences, 553 pp.
Vol. 3, Biological Sciences, 980 pp.
Vol. 4, Materials Science, 1130 pp.

Lyman, C. E., Newbury, D. E., Goldstein, J. I., Williams, D. B., Romig, Jr. A. D., Armstrong, J.
T., Echlin, P., Fiori, C. E., Joy, D. C., Lifshin, E., and Peters, K-R., Scanning Electron
Microscopy, X-ray Microanalysis, and Analytical Electron Microscopy: A Laboratory
Workbook, 407 pp., Plenum Press, New York, NY (1990).

Williams, D. B., Pelton, A. R., and Gronsky, R., (Eds.) Images of Materials, 379 pp., Oxford
University Press, New York, NY (1991).

Williams, D. B., Goldstein, J. I. and Newbury, D. E., (Eds.) X-ray Spectrometry in Electron
Beam Instruments, 372 pp., Plenum Press, New York, NY (1995).

Williams D. B. and Carter, C. B. Transmission Electron Microscopy-A Textbook for Materials
Science, 750 pp., Plenum Press, New York, NY (1996).

Pond, R. C., Clark, W. A. T., King, A.H. and Williams, D. B. (Eds.) Boundaries & Interfaces In
Materials, (The David A. Smith Symposium) 348 pp., TMS, Warrendale, PA, (1998).


1 Thomas, G., Carter, C. B., De Hosson, J. Th. M., Gerberich, W. W., Gronsky, R., Humphreys, C.
J., Nix, W. D., Ruhle, M., Seidman, D. and Williams, D.B. (Eds.) Materials Science &
Mechanics of Interfaces, Proceedings of Acta Materialia Workshop, Acta Mat, 47 3937-
4252, (1999).

Williams D. B. and Shimizu, R. (Eds.) Microbeam Analysis 2000, Institute of Physics
Conference Series 165, 498 pp., The Institute of Physics, Bristol and Philadelphia, PA,
(2000)
II. Refereed Individual Chapters/Papers in Books
1. Williams, D. B. and Goldstein, J. I., Artifacts Encountered in Energy Dispersive X-ray
Spectrometry in the Analytical Electron Microscopy, in NBS Special Publication 604
Energy Dispersive Spectrometry, eds. K. F. J. Heinrich, D. E. Newbury, R. L. Myklebust and
C. E. Fiori, 341-349 (1981).

2. Williams, D. B., Microstructural Characteristics of Al-Li Alloys, in Aluminum-Lithium
Alloys, eds. T. H. Sanders, Jr. and E. A. Starke, Jr., TMS-AIME, Warrendale, PA 89-100
(1981).

3. Notis, M. R., Bender, B. A. and Williams, D. B., STEM Analysis of Segregation and
Precipitation in Impurity-Doped Nickel Oxide, in Advances in Ceramics, eds. L. M.
Levinson and D. C. Hill, The American Ceramic Society, 1, 91-100 (1981).

4. Goldstein, J. I. and Williams, D. B., X-ray Microanalysis of Thin Specimens, in
Quantitative Microanalysis with High Spatial Resolution, eds. G. W. Lorimer, M. H. Jacobs
and P. Doig, The Metals Society, London, Book 277, 5-14 (1981) (Invited)

5. Wood, J., Williams, D. B., and Goldstein, J. I., Determination of Cliff-Lorimer k Factors for
a Philips EM 400T, in Quantitative Microanalysis with High Spatial Resolution, eds. G. W.
Lorimer, M. H. Jacobs and P. Doig, The Metals Society, London, Book 277, 24-30 (1981).

6. Stenton, N., Notis, M. R., Goldstein, J. I. and Williams, D. B., Determination of
(
t) Curves
for Thin Foil Microanalysis, in Quantitative Microanalysis with High Spatial Resolution,
eds., G. W. Lorimer, M. H. Jacobs and P. Doig, The Metals Society, London, Book 277, 35-
40 (1981).

7. Goldstein, J. I. and Williams, D. B., Low Temperature Phase Transformations in the
Metallic Phase of Meteorites, in Solid-Solid Phase Transformations, ed. H. I. Aaronson,
TMS-AIME, Warrendale, PA 715-719 (1982).

8. Chen, C. H., Notis, M. R. and Williams, D. B., Precipitation Phenomena in the NiO-Cr2O3
System, in Solid-Solid Phase Transformations, ed. H. I. Aaronson, TMS-AIME,
Warrendale, PA 721-725 (1982).

9. Merchant, S. M., Notis, M. R. and Williams, D. B., Analytical Electron Microscopy Study
of Precipitate Free Zones in Al-Ag, in Solid-Solid Phase Transformations, ed. H. I.
Aaronson, TMS-AIME, Warrendale, PA 733-737 (1982).

10. Butler, E. P. and Williams, D. B., Initiation of the Grain Boundary Discontinuous
Reactions, in Solid-Solid Phase Transformations, ed. H. I. Aaronson, TMS-AIME,
Warrendale, PA 909-913 (1982).

11. Notis, M. R., Williams, D. B. and Stenton, N., Analytical Electron Microscopy of Two-
Phase and Single-Phase Interfaces in Ceramic Systems, in Advances in Ceramics, eds. M. F.
Yan and A. H. Heuer, The American Ceramic Society, 6, 289-299 (1983).


2 12. Tsai, H. L., Williams, D. B. and Butler, S. R., Morphology of the Cl-Containing Phase at
the Si/SiO2 Interface Formed During the HCl/O2 Oxidation of Silicon, in Advances in
Ceramics, eds. M. F. Yan and A. H. Heuer, The American Ceramic Society, 7, 269-280
(1983).

13. Williams, D. B. and Newbury, D. E., "Recent Advances in the Electron Microscopy of
Materials" in Advances in Electronics and Electron Physics ed. P. W. Hawkes, Academic
Press, New York, NY, 62, 161-288, (1984).

14. Williams, D. B., "An Overview of Analytical Electron Microscopy" in Electron Microscopy
of Materials, eds. W. Krakow, D. A. Smith and L. W. Hobbs, North Holland, New York, NY,
11-22 (1984).

Williams, D. B., Analytical Electron Microscopy, in Encyclopedia of Materials Science and
Engineering, ed. M. B. Bever, Pergamon Press, New York, 188-192 (1986).

Williams, D. B., Electron Diffraction, in Encyclopedia of Materials Science and Engineering,
ed. M. B. Bever, Pergamon Press, New York, 1450-1454 (1986).

Williams, D. B., Transmission Electron Microscopy, in Encyclopedia of Materials Science and
Engineering, ed. M. B. Bever, Pergamon Press, New York, 5136-5140 (1986).

15. Williams, D. B., Goldstein, J. I. and Fiori, C. E., "Principles of Energy Dispersive
Spectrometry" in Principles of Analytical Electron Microscopy, eds. D. C. Joy, A. D. Romig,
Jr. and J. I. Goldstein, Plenum Press, New York, NY, 123-153 (1986).

16. Michael, J. R. and Williams, D. B., Solute Profiles Around Migrating Grain Boundaries in
Al-4.7% Cu, in Interface Migration and Control of Microstructure, eds. C. S. Pande, D. A.
Smith, A. H. King and J. Walter, American Society for Metals, Metals Park, OH, 73-81
(1986).

17. Goldstein, J. I., Williams, D. B. and Cliff, G., "Quantification of Energy Dispersive Spectra"
in Principles of Analytical Electron Microscopy, eds. D. C. Joy, A. D. Romig, Jr. and J. I.
Goldstein, Plenum Press, New York, 155-217 (1986).

18. Williams, D. B., "Metallography in the STEM" in Handbook of Applied Metallography, ed.
G. F. Vander Voort, Van Nostrand Reinhold, New York, NY, 171-196 (1986).

19. Klein, C. F., Ayer, R. and Williams, D. B., Effect of Accelerating Voltage and Electron
Source Brightness on the Spatial Resolution of X-ray Microanalysis, in Intermediate
Voltage Microscopy and its Application to Materials Science, ed. K. Rajan, Electron Optics
Publishing Group, Mahwah, NJ, 24-28 (1987). [Also published in Philips Electron Optics
Reporter, 34, 1-5 (1987)].

20. Sankar, J., Williams, D. B. and Pense, A. W., Fractography of Pressure Vessel Steel
Weldments, in Fractography of Modern Engineering Composites and Metals, ASTM STP
948, eds. J. E. Masters and J. J. Au, ASTM, Philadelphia, 295-316 (1987).

21. Williams, D. B., "Analytical Electron Microscopy" in Advanced Techniques for
Microstructural Characterization, eds. R. Krishnan, T. Anantharaman, C. S. Pande and O. P.
Arora, Trans. Tech. Publications, Aedermannsdorf, Switzerland, 15-32 (1988).

22. Williams, D. B., Electron Energy Loss Spectrometry, in Encyclopedia of Materials
Science and Engineering, First Supplement, Pergamon Books Ltd., Oxford, 152-155 (1988).


3 23. Williams, D. B. and Howell, P. R., "The Microstructure of Aluminum-Lithium Base Alloys"
in Aluminum Alloys: Contemporary Research and Applications, eds. A.