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NFP1003 H
ERMETIC
M
ICROWAVE
S
URFACE
M
OUNT
N
OISE
S
OURCE
100 MH
Z TO
3 GH
Z
The NFP1003 Noise Source features
high ENR output in a small SMT
package, ideal for military and other
harsh environment applications.
The high output can allow for signifi-
cant circuit loss such as that caused
by power splitters, switches and
directional couplers, and still have
enough noise signal without addition-
al amplification.
All biasing circuitry is built-in making
it easy to design into your system.
The NFP1003 features a built-in volt-
age regulator for highly stable output
even if your DC supply lines are not.
Frequency:
100 MHz to 3GHz
ENR:
100 MHz - 1 GHz 43 - 48 dB
1 GHz - 2 GHz 41 - 46 dB
2 GHz - 3 GHz 40 - 45 dB
ENR Temp COEF: 0.04 db/
o
C max
VSWR: 2.0:1 max, On or Off state
BIAS: +12 to +28Vdc @50mA max
Hermetic Seal: 1x10
-7
atm cc/s
Operating Temp: -40 to +85 C
Storage Temp:
-54 to +125 C
C
OMMON
A
PPLICATIONS
:
S
PECIFICATIONS
NFP1003 T
YPICAL
D
ATA
There are two primary uses for employing a noise signal for built-in test.
1. Noise Temperature (noise figure) or sensitivity testing: This test uses the noise source to supply a
known excess noise ratio (ENR) to a device under test for a Y-factor measurement. By taking two
receiver readings, one with the noise on and one with it off, Y-factor can be determined. By knowing
the ENR and Y-factor, one can calculate noise temperature (figure) or sensitivity.
2. Frequency Response: The noise source being broadband can be used as a replacement of a swept
source to calculate frequency response of a receiver or other device. By putting in a known spectral
signal at the input and taking a reading at the output, one can determine the gain or loss over frequency
of the entire system. Noise sources are inherently extremely stable devices. In addition, the circuitry is
much simpler than a swept source which increases reliability and lowers cost.
For more information on using noise for built-in-test, read the Feb 2004 Microwave Journal article authored
by Patrick Robbins of Micronetics.

http://www.micronetics.com/articles/microwave_journal_02-04.pdf

Using noise for built-in test:
E N R MICRONETICS, HUDSON, NH 03051 / TEL: 603-883-2900 / FAX: 603-882-8987 / NOISESALES@MICRONETICS.COM WWW.MICRONETICS.COM
NFP1003 H
ERMETIC
M
ICROWAVE
S
URFACE
M
OUNT
N
OISE
S
OURCE
100 MH
Z TO
3 GH
Z
O
UTLINE
D
RAWING
Calculating Y-Factor: Y
Fact
= N
2
/ N
1
Where N
2
is measured power output with noise source on and N
1
is the measured
power output with noise source off.
Calculating noise figure from ENR and Y-Factor: NF(dB) = ENR (dB) - 10 log10 (Y
Fact
-1)
Converting ENR to noise spectral density (N
0
): 0 dB ENR = -174 dBm/Hz
Calculating noise power in a given bandwidth (BW) from noise spectral density: Power (dBm) = N
0
+ 10log(BW)
U
SEFUL
N
OISE
E
QUATIONS